Referenced Items are not available for this document.
A new method based on application of millimeter waves for measurement of complex refractive index of thin semiconductor films on high resistive substrates is described.
Published in:
Microwave and Telecommunication Technology, 2004. CriMico 2004. 2004 14th International Crimean Conference on
Date of Conference: 13-17 Sept. 2004
- Page(s):
- 619 - 620
- Print ISBN:
- 966-7968-69-3
- INSPEC Accession Number:
- 8245672
- Digital Object Identifier :
- 10.1109/CRMICO.2004.183364
- Product Type:
- Conference Publications
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
