Referenced Items are not available for this document.
Digital noise in mixed-signal circuits is characterized using a scalable macromodel for substrate noise coupling. The noise coupling obtained through simulations is verified with measured data from a digital noise generator and noise sensitive analog circuits fabricated in the 0.35-μm heavily doped CMOS process. The simulations and measurements also demonstrate the effectiveness of including grounded guard rings and separating bulk and supply pins in digital circuits to reduce substrate coupling.
Published in:
Solid-State Circuits, IEEE Journal of
(Volume:40
,
Issue:
2
)
Date of Publication: Feb. 2005
- Page(s):
- 382 - 391
- ISSN :
- 0018-9200
- INSPEC Accession Number:
- 8276581
- Digital Object Identifier :
- 10.1109/JSSC.2004.841039
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 31 January 2005
- Issue Date :
- Feb. 2005
- Sponsored by :
- IEEE Solid-State Circuits Society
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