By Topic

A technique based on the OMG metamodel and OCL for the definition of object-oriented metrics applied to UML models

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Debnath, N. ; Dept. of Comput. Sci., Winona State Univ., MN, USA ; Riesco, D. ; Montejano, G. ; Uzal, R.
more authors

Summary form only given. The development of wide software systems is an activity that consumes great quantities of time and resources. Even with the increase of the automation in the software development activities, the resources stay scarce. As a consequence of this, there is a big interest in the metrics of software due to its potential for a better, more efficient use of the resources. Tools help and assist in the planning and in the estimation of the complexity of the applications to develop during different stage of a process. We describe a technique to define metrics using the OMG (Object Management Group) standard specification. The semantic in each metrics is specified formally with OCL (Object Constraint Language) based on OMG metamodels. For their concrete specification, we establish a series of steps that allows define uniformly each metric in the different RUP models. Furthermore, the present paper shows the use of metrics defined using this technique and the relation between data obtained from the application of the metrics to thirteen object oriented systems. They encompass projects from the capture of requirements until its implementation, showing the metrics applied in different stage of the deployment.

Published in:

Computer Systems and Applications, 2005. The 3rd ACS/IEEE International Conference on

Date of Conference:

2005