By Topic

A Novel Approach to Auto Image Annotation Based on Pairwise Constrained Clustering and Semi-Na ï ve Bayesian Model

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Shi Rui ; National University of Singapore ; Wanjun Jin ; Tat-Seng Chua

Automatic image annotation has been intensively studied for content-based image retrieval recently. In this paper, we propose a novel approach for this task. Our approach first performs the segmentation of images into regions, followed by the clustering of regions, before learning the associations between concepts and region clusters using the set of training images with pre-assigned concepts. The main focus of this paper and our main contributions are as follows. First, in the learning stage, we perform clustering of regions into region clusters by incorporating pair-wise constraints derived by considering the language model underlying the annotations assigned to training images. Second, in the annotation stage, to alleviate the restriction of the independence assumption between region clusters, we develop a greedy selection and joining algorithm to find the independent sub-sets of region clusters and employ a semi-naïve Bayesian (SNB) model to compute the posterior probability of concepts given those independent sub-sets. Experimental results show that our proposed system utilizing these two strategies outperforms the state-of-the-art techniques in large image collection.

Published in:

Multimedia Modelling Conference, 2005. MMM 2005. Proceedings of the 11th International

Date of Conference:

12-14 Jan. 2005