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Minimizing the number of test configurations for FPGAs

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1 Author(s)
Chmelar, E. ; Center for Reliable Comput., Stanford Univ., Palo Alto, CA, USA

FPGA test cost can be greatly reduced by minimizing the number of test configurations. A test technique is presented for FPGAs with multiplexer-based routing architectures in which multiple logical paths through each multiplexer is enabled instead of only one path. It is shown that for Xilinx Virtex-II and Spartan-3 FPGAs only 8 test configurations are required to achieve 100% stuck-at, PIP stuck-on, and PIP stuck-off fault coverage.

Published in:

Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on

Date of Conference:

7-11 Nov. 2004