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To analyze the failure of a CMOS circuit due to glitches induced by capacitive crosstalk, noise immunity curves (a.k.a. noise rejection curve) must be characterized. However, noise waveform models currently used for characterization such as ideal triangle and trapezoid can underestimate the propagated noise pulse by over 20% and result in missed violations. We provide an analytical solution to fit any given crosstalk noise waveform to a Weibull function, which can generate identical propagated glitch heights compared to SPICE, resulting in accurate noise immunity curves.