Cart (Loading....) | Create Account
Close category search window
 

The impact of combined channel mismatch effects in time-interleaved ADCs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Vogel, C. ; Christian Doppler Lab. for Nonlinear Signal Process., Graz Univ. of Technol., Austria

A time-interleaved multichannel analog-to-digital converter (ADC) achieves high sampling rates with the drawback of additional distortions caused by channel mismatches. In this paper, we consider the dependency of the signal-to-noise-and-distortion ratio (SINAD) on the combination of several different channel mismatch effects. By using either explicitly given mismatch parameters or given parameter distributions, we derive closed-form equations for calculating the explicit or the expected SINAD for an arbitrary number of channels. Furthermore, we extend the explicit SINAD by the impact of timing jitter. We clarify how channel mismatches interact and perform a worst case analysis of the explicit SINAD for individual mismatch errors. We also show that equations describing the expected SINAD of individual mismatch errors are special cases of our general formulation. We indicate how to use the expected SINAD for finding efficient optimization priorities and demonstrate the importance of worst case analyses.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:54 ,  Issue: 1 )

Date of Publication:

Feb. 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.