Cart (Loading....) | Create Account
Close category search window
 

Companding transform for reduction in peak-to-average power ratio of OFDM signals

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Xiao Huang ; Dept. of Electron. Eng., Tsinghua Univ., Beijing, China ; Jianhua Lu ; Junli Zheng ; Letaief, K.B.
more authors

A general companding transform method is proposed to effectively reduce peak-to-average power ratio (PAPR) of orthogonal frequency division multiplexing (OFDM) signals. By compressing large signals while enhancing small signals along with taking into account their statistical characteristics, this method can achieve significant reduction in PAPR with low implementation complexity. Specifically, we present the design criteria of the transform, which enable effective tradeoff between reduction in PAPR and bit-error rate performance of the OFDM system. It is shown by simulations that the proposed method may significantly improve the performance of OFDM systems in radio channels by carefully choosing the companding form and parameters.

Published in:

Wireless Communications, IEEE Transactions on  (Volume:3 ,  Issue: 6 )

Date of Publication:

Nov. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.