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Measurement and analysis for stripline material parameters using network analyzers

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3 Author(s)
Davis, William A. ; Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Uni., Blacksburg, VA, USA ; Bunting, C.F. ; Bucca, S.E.

The characterization of material parameters for dielectrics used in the construction of stripline and related structures is presented. The measured scattering parameters of transmission-line samples are used to predict the characteristics of the dielectric materials used in the construction in addition to effects due to rough dielectric-conductor interfaces. The measurements have been performed using a network analyzer with the `thru-reflect-line' calibration technique. The calibration process, the structure of the transmission-line sample, and the frequency-domain model are reviewed. Measured results are presented with predicted values for the dielectric constant and loss tangent of dielectric materials common in thick-film structures

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:41 ,  Issue: 2 )

Date of Publication:

Apr 1992

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