Analysis of single-event effects in continuous-time Delta-Sigma Modulators

Behavioral simulations are carried out for characterizing single-event effects in continuous-time Delta-Sigma modulators, the core subsystem of an oversampling analog-to-digital converter. The performed study shows that some topologies are less immune than others to single-event hits and that by appropriately choosing the order and oversampling ratio of the modulators one can reduce the radiation effects.