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Use of light-ion-induced SEU in devices under reduced bias to evaluate their SEU cross section

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10 Author(s)
Barak, J. ; Soreq Nucl. Res. Center, Yavne, Israel ; Haran, A. ; Adler, E. ; Azoulay, M.
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Single-event upset (SEU) cross section was measured for several devices under reduced bias with light ions, in particular α-particles. The results show that α-particles can be used, in a simple manner, for testing devices in order to save accelerator time. A proportionality law was found for scaling the reduced bias results to normal operation bias.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:51 ,  Issue: 6 )

Date of Publication:

Dec. 2004

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