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Dynamic testing of Xilinx Virtex-II field programmable gate array (FPGA) input/output blocks (IOBs)

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10 Author(s)
Swift, G.M. ; Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA ; Rezgui, S. ; George, J. ; Carmichael, C.
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Heavy-ion irradiation and fault injection experiments were conducted to evaluate the upset sensitivity of the Xilinx Virtex-II field programmable gate arrays (FPGAs) input/output block (IOB). Full triple module redundancy (TMR) of the IOBs, in combination with regular configuration scrubbing, proved to be a quite effective upset mitigation method.

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Nuclear Science, IEEE Transactions on  (Volume:51 ,  Issue: 6 )