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Browse Journals & Magazines > Nuclear Science, IEEE Transac ...> Volume:51 Issue:6 Help

Single event transient pulsewidth measurements using a variable temporal latch technique

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7 Author(s)
Eaton, P. ; ATK Mission Res., Albuquerque, NM, USA ; Benedetto, J. ; Mavis, D. ; Avery, K.
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A new test structure was designed for measuring the pulsewidths of transients created by SETs. Experimental data was gathered using heavy ions from LETs of 11.5 to 84MeV-cm2/mg. The pulsewidths of SETs generated using heavy ions are measured using a variable temporal latch. Our SET's widths at low LETs agree exceptionally well with previous localized beam measurements.

Published in:
Nuclear Science, IEEE Transactions on  (Volume:51 ,  Issue: 6 )

Date of Publication: Dec. 2004

Page(s):
3365 - 3368
ISSN :
0018-9499
INSPEC Accession Number:
8225490
Digital Object Identifier :
10.1109/TNS.2004.840020
Product Type:
Journals & Magazines
Date of Current Version :
20 December 2004
Issue Date :
Dec. 2004
Sponsored by :
IEEE Nuclear and Plasma Sciences Society

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