By Topic

Spatial distribution of electron-hole pairs induced by electrons and protons in SiO2

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Murat, M. ; Soreq Nucl. Res. Center, Yavne, Israel ; Akkerman, A. ; Barak, J.

The spatial distribution of electron-hole pairs in SiO2, induced by electrons and protons, was simulated using a new Monte Carlo (MC) code which calculates the full track structure with parameters found using the complex dielectric function theory for electron energies above 50 eV. For electrons below 50 eV, we included interactions with phonons. Track structure calculations were used to find the spatial distribution of the electron-hole pairs. The charge-yield for electrons and protons under electric field has been calculated directly, without using either the columnar or the geminate models for charge recombination. A good agreement is found with experimental charge-yield results.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:51 ,  Issue: 6 )