Cart (Loading....) | Create Account
Close category search window
 

Beam monitors for TESLA based on diamond strip detectors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)

For TeV energy superconducting linear accelerator (TESLA), it is foreseen to measure the beam profile with so-called wire scanners. A thin carbon fiber is moved through the beam and the number of scattered secondary particles is measured in correlation to the position of the wire. From this, a beam profile can be calculated as an average over many bunches of the beam. With strip detectors made from diamond, the beam profile can be measured online for single bunches. With two perpendicular arrays of strips on the front and the back side of the detector, the beam profile can also be measured in the X and Y direction. If fast electronics are used and the bunches are not too short, even a longitudinal profile in the Z direction can be obtained. We successfully tested a diamond detector in a heavy ion beam with bunches of up to 3·1010 O6+ ions and in a beam of 1010 electrons in bunches with a length of 300 μm, as planned for TESLA. The fluence of 1015 e-/cm2 or more by one of the bunches foreseen for TESLA corresponds to the irradiation a vertex detector receives during ten years of large hadron collider. The results of our measurements will be presented and discussed.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:51 ,  Issue: 6 )

Date of Publication:

Dec. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.