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Enhancing yield at the end of the technology roadmap

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3 Author(s)

Scaled manufacturing technologies require advanced techniques for improving device reliability and production yield. We present a transistor-level redundancy technique for manufacturing devices with low vulnerability and improving yield in future circuits The technique relies on appropriate design style selection and controlled redundancy to achieve area and power trade-offs.

Published in:

Design & Test of Computers, IEEE  (Volume:21 ,  Issue: 6 )

Date of Publication:

Nov.-Dec. 2004

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