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2-D thermal imaging of the optical power distribution in photonic integrated circuits

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3 Author(s)
Luerssen, D. ; Dept. of Phys., Mount Holyoke Coll., South Hadley, MA, USA ; Ram, R.J. ; Hudgings, J.A.

We present a surface imaging method that allows monitoring of the optical power distribution inside photonic integrated circuits. We demonstrate this technique on a semiconductor optical amplifier and compare results with direct optical measurements.

Published in:

Lasers and Electro-Optics Society, 2004. LEOS 2004. The 17th Annual Meeting of the IEEE  (Volume:1 )

Date of Conference:

7-11 Nov. 2004