Cart (Loading....) | Create Account
Close category search window
 

Dynamical effects of missed switching in current-mode controlled DC-DC converters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Banerjee, S. ; Dept. of Electr. Eng., Indian Inst. of Technol., Kharagpur, India ; Parui, S. ; Gupta, A.

Past investigations on nonlinear phenomena in DC-DC converters assume ideal switching and ignore the practical issue of switching ripples, for which the sampled data models yield piecewise smooth but continuous maps. In this brief, we show that the unavoidable nonidealities in the switching result in discontinuity in the map, which drastically changes the bifurcation structures. We demonstrate these effects experimentally, and develop simple one-dimensional models that account for switching delay and transients, and can predict the bifurcations in such systems with reasonable accuracy. Using the recent developments in bifurcation theory, we derive the limiting conditions for a reliable period-1 operation when these effects are considered.

Published in:

Circuits and Systems II: Express Briefs, IEEE Transactions on  (Volume:51 ,  Issue: 12 )

Date of Publication:

Dec. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.