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A new design for built-in self-test of 5GHz low noise amplifiers

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2 Author(s)
Jee-Youl Ryu ; Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA ; Kim, B.C.

This paper presents a new low-cost built-in self-test (BIST) circuit for 5GHz low noise amplifier (LNA). The BIST circuit is designed for system-on-chip (SOC) transceiver environment. The proposed BIST circuit measures the LNA specifications such as input impedance, voltage gain, noise figure, and input return loss all in a single SoC environment.

Published in:

SOC Conference, 2004. Proceedings. IEEE International

Date of Conference:

12-15 Sept. 2004