By Topic

An incremental approach for test scheduling and synthesis using genetic algorithms

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
2 Author(s)
H. Harmanani ; Dept. of Comput. Sci., Lebanese American Univ., Byblos, Lebanon ; A. Hajar

This paper presents a new and an efficient method for concurrent BIST synthesis and test scheduling. This method maximizes concurrent testing of modules while performing the allocation of functional units, test registers, and multiplexers. The method is based on a genetic algorithm that efficiently explores the testable design space. The method was implemented using C++ on a Linux workstation. Several benchmark examples have been implemented and favorable results are reported.

Published in:

Circuits and Systems, 2004. NEWCAS 2004. The 2nd Annual IEEE Northeast Workshop on

Date of Conference:

20-23 June 2004