Cart (Loading....) | Create Account
Close category search window

Target fluctuation models and their application to radar performance prediction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
De Maio, A. ; Dipt. di Ingegneria Elettronica e delle Telecomunicazioni, Napoli, Italy ; Farina, A. ; Foglia, G.

The authors address the design, analysis, and experimental validation of statistical models for the description of targets fluctuations. First some classical distributions commonly employed for the statistical characterisation of the target amplitude returns are reviewed. Then, the authors focus on the shadowed Rice and the two-state Rayleigh-chi target models, discussing their physical justification and relevant analytical properties. The capabilities of the considered models to fit real target data collected by the McMaster IPIX radar in 1993 are also studied. Finally, the performance of the optimum detector (in the Neyman-Pearson sense) for targets with uniformly distributed phases in the presence of shadowed Rice and two-state Rayleigh-chi fluctuations is studied and analytical expressions are provided for the detection probability.

Published in:

Radar, Sonar and Navigation, IEE Proceedings -  (Volume:151 ,  Issue: 5 )

Date of Publication:

10 Oct. 2004

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.