By Topic

Computing bit-error probabilities for avalanche photodiode receivers by large deviations theory

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Letaief, K.B. ; Dept. of Electr. & Electron. Eng., Melbourne Univ., Parkville, Vic., Australia ; Sadowsky, J.S.

A bit error probability analysis of direct detection optical receivers is presented employing avalanche photodiodes. An asymptotic analysis for large signal intensities is presented. This analysis provides some useful insight into the balance between the Poisson statistics, the avalanche gain statistics, and the Gaussian thermal noise. The conjugate distribution is developed. It is obtained by applying the large-deviation exponential twisting formula. It is demonstrated that this conjugate distribution can be used to obtain numerically efficient Monte Carlo estimates of the bit-error probability via the importance sampling method

Published in:

Information Theory, IEEE Transactions on  (Volume:38 ,  Issue: 3 )