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Analysis of crosstalk interference in CMOS integrated circuits

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2 Author(s)
E. Sicard ; Dept. of Electr. Eng., INSA-DGE, Toulouse, France ; A. Rubio

The authors show how crosstalk coupling between transmission lines inside CMOS integrated circuits can provoke faulty behavior by affecting the propagation delay of the logic and analog cells. A simplified model for the evaluation of parasitic capacitive coupling effects is proposed, and the influence of crosstalk on the behavior of basic functions such as logic gates, latches, RAM memory, and analog-to-digital converters is evaluated

Published in:

IEEE Transactions on Electromagnetic Compatibility  (Volume:34 ,  Issue: 2 )