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De-embedding procedure based on computed/measured data set for pcb structures characterization

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3 Author(s)
Antonini, G. ; Dept. of Electr. Eng., Univ. of L''Aquila, Italy ; Scogna, A.C. ; Orlandi, A.

This paper uses a de-embedding procedure, based on measured and numerically computed S-parameters, to obtain the characterization of portions of a structure difficult to obtain by direct measurements. The results are validated by measurements and independent calculations.

Published in:

Advanced Packaging, IEEE Transactions on  (Volume:27 ,  Issue: 4 )