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Megarad total ionizing dose and single event effects test results of a radhard-by-design 0.25 micron ASIC [space applications]

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4 Author(s)
M. Hartwell ; Aeroflex Colorado Springs, Inc., Colorado Springs, CO, USA ; C. Hafer ; P. Milliken ; T. Farris

Total ionizing dose (>1 Mrad(Si)) and SEE test results at two commercial foundries for a 0.25 μm radhard-by-design ASIC are reported in this paper. Radhard-by-design techniques provide denser, faster and lower power space applications.

Published in:

Radiation Effects Data Workshop, 2004 IEEE

Date of Conference:

22-22 July 2004