Dynamic SDRAM SEFI detection and recovery test results

Single event functionality interrupt (SEFI) results are presented for Hynix SDRAMS. The SEFI response threshold is below LET 9.9 Mev-cm/sup 2//mg and the saturated cross section is 6/spl times/10/sup -5/cm/sup 2/. Dynamic SEFI identification was made, and in-situ recovery restored functionality. Verification results of the identification algorithm are presented. An observed high current radiation response is also presented.