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Test results of total ionizing dose conducted at the Jet Propulsion Laboratory [bipolar and CMOS ICs]

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5 Author(s)
Rivas, R.M. ; Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA ; Johnston, A.H. ; Miyahira, T.F. ; Rax, B.G.
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This paper reports recent total ionizing dose (TID) test results obtained at JPL. Several device samples were analyzed exhibiting significant failure levels and enhanced low dose rate sensitivity (ELDRS) effects under biased and unbiased conditions.

Published in:

Radiation Effects Data Workshop, 2004 IEEE

Date of Conference:

22-22 July 2004