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Current single event effects results for candidate spacecraft electronics for NASA

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29 Author(s)
O'Bryan, M.V. ; NASA Goddard Space Flight Center, Greenbelt, MD, USA ; Seidleck, C.M. ; Carts, M.A. ; Howard, J.W.
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We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects. Devices tested include digital, analog, linear bipolar, and hybrid devices, among others.

Published in:

Radiation Effects Data Workshop, 2004 IEEE

Date of Conference:

22-22 July 2004