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A pulse shape analysis technique was implemented to determine electron mobility, μe, and electron mobility lifetime product, μeτe in cadmium zinc telluride detectors (CZT). The digital gamma finder, (DGF-4C), a single width CAMAC module produced by X-ray Instrumentation Associates (XIA), was used to extract pulse height, pulse shape, and signal rise time information. Post data acquisition analysis using the extracted information allowed measuring the μe and μeτe, in selected CZT samples. An almost linear relationship was observed for the signal rise time as a function of the inverse bias. This observed linear relationship was the basis for determination of μe using a simple linear fit. The measured signal amplitude was also used to determine μeτe using the Hecht formulation. Repeated measurements carried out confirmed the consistency of the method in determining μe and μeτe.