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A tanh substitution technique for the analysis of abrupt and graded interface multilayer dielectric stacks

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3 Author(s)
Corzine, S.W. ; Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA ; Yan, R.H. ; Coldren, L.A.

The authors report a new analytical technique for estimating the peak reflectivity of lossless dielectric stacks with combinations of quarter and/or half-wave thicknesses. A simple variable substitution is used to transform the standard formula for the reflectivity of a Fabry-Perot resonator into a remarkably simplified form. The resulting expressions for reflectivity are intuitively appealing, allowing use of additive algebra to calculate the peak reflectivity of a multilayer dielectric stack

Published in:

Quantum Electronics, IEEE Journal of  (Volume:27 ,  Issue: 9 )

Date of Publication:

Sep 1991

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