Cart (Loading....) | Create Account
Close category search window
 

A novel analysis technique of power supply noise (PSN) for CMOS circuits using external current sensor with automatic test equipment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Liau, E. ; MP Technol. & Innovation, Infineon Technol. AG, Munich, Germany ; Schmitt-Landsiedel, D.

The major drawback of PSN simulation approach is the fact that it is guaranteed only for a particular set of simulated tests, as the actual PSN value can change if we use a different set of tests. On the other hand, conventional ATE can not detect a dynamic peak current or spike with a very high resolution due to the constraint of slow measurement sampling frequency. Thereby, it is very difficult to analyze design weaknesses due to PSN issue by ATE as well as by simulation approach. In this paper, we proposed to capture the high-resolution dynamic peak current using a high-speed external current sensor and a digital oscilloscope. The oscilloscope is controlled by ATE via standard IEEE-488 GPIB, such that a high resolution of dynamic current profiles with respect to different specific test sequences can be analyzed in detail automatically. Furthermore, we use computational intelligence techniques (CIT) such as neural network and genetic algorithm with ATE to improve the test with respect to the defected (full-chip) dynamic peak current. Our experimental results demonstrate the improvement of the (full-chip) dynamic peak current acquisition, and better worst case tests can be detected practically with this approach.

Published in:

Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE  (Volume:3 )

Date of Conference:

18-20 May 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.