Close category search window
 

Guided Lamb waves and L-SAFT processing technique for enhanced detection and imaging of corrosion defects in plates with small depth-to wavelength ratio

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Sicard, R. ; Inst. de Recherche, Quebec Univ., Trois-Rivieres, Que., Canada ; Chahbaz, A. ; Goyette, J.

The Lamb synthetic aperture focusing technique (L-SAFT) imaging algorithm in the Fourier domain is used to produce Lamb wave imaging in plates while considering the wave dispersive properties. This artificial focusing technique produces easy-to-interpret, modified B-scan type images of Lamb wave inspection results. The high level of sensitivity of Lamb waves combined with the L-SAFT algorithm allows one to detect and to produce images of corrosion defects with small depth-to-wavelength ratio. This paper briefly presents the formulated L-SAFT algorithm used for Lamb waves and, in more details, some experimental results obtained on simulated and real corrosion pits, demonstrating the benefit of combining L-SAFT with pulse-echo Lamb wave inspection. The obtained images of the real corrosion defects showed detection of pits with a depth-to-wavelength ratio of approximately 2/11.

Published in:
Ultrasonics, Ferroelectrics and Frequency Control, IEEE Transactions on  (Volume:51 ,  Issue: 10 )

Date of Publication: Oct. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.