By Topic

Electromagnetic susceptibility analysis in device level with numerical technique based on electric field integral equation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Wei Liang Yuan ; Computational Electromagn. & Electron. Dept, Inst. of High Performance Comput., Singapore, Singapore ; Erping Li

With the advance in high-speed electronics and the presence of new standards on electromagnetic susceptibility, EMS analysis and evaluation is becoming increasingly important. This paper investigates EMS of shielded electronic equipment in the device level by using a full-wave numerical technique combined with a circuit-based method. The method of moments in terms of the mixed-potential electric field integral equation for the geometries of arbitrary combined wire/surface is developed for susceptibility evaluation. With numerical analysis, the effect of external EM noise on electronic equipment is characterized and an equivalent secondary source model is extracted for further EMS analysis of internal high-speed susceptible circuits at a lower board level.

Published in:

Electromagnetic Compatibility, 2004. EMC 2004. 2004 InternationalSymposium on  (Volume:1 )

Date of Conference:

9-13 Aug. 2004