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A new model called ICEM (integrated circuits electromagnetic model) is currently under standardization process. It is proposed under the IEC 62014-3 reference and is aimed at modeling radiated and conducted parasitic emissions of integrated circuits on printed circuit boards (PCB). This paper deals with the validation and extraction of ICEM parameters on an integrated circuit (microcontroller), allowing the designer to predict conducted noise level. First of all, this paper describes an approach for ICEM model generation on an integrated circuit. An 8-bit microcontroller (RISC, AVR Core, etc.) has been selected as the test vehicle. The test board and the measurement setup are then described. Finally, the influence of design parameters like decoupling capacitors is discussed.