Cart (Loading....) | Create Account
Close category search window
 

Characteristics of fault-tolerant photodiode and photogate active pixel sensor (APS)

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
La Haye, M.L. ; Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada ; Chapman, G.H. ; Jung, C. ; Cheung, D.Y.H.
more authors

A fault-tolerant APS has been designed by splitting the APS pixel into two halves operating in parallel, where the photo sensing element has been divided in two and the readout transistors have been duplicated while maintaining a common row select transistor. This split design allows for a self correcting pixel scheme such that if one half of the pixel is faulty, the other half can be used to recover the entire output signal. The fault tolerant APS design has been implemented in a 0.18 μm CMOS process for both a photodiode based and photogate based APS. Test results show that the fault tolerant pixels behave as expected where a non-faulty pixel behaves normally, and a half faulty pixel, where one half is either stuck low or high, produces roughly half the sensitivity. Preliminary results indicate that the sensitivity of a redundant pixel is approximately three times that of a traditional pixel for the photodiode APS and approximately twice that for the photogate APS.

Published in:

Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on

Date of Conference:

10-13 Oct. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.