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A review of the single event effects performance of x86 microprocessors

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2 Author(s)

The paper presents a review of the experimental single event upset performance of the Pentium®4, Pentium® III, Pentium® II, Celeron®, and Pentium® MMX microprocessors using proton irradiation. Results are compared with previously tested x86 microprocessors. Single event latchup and total dose effects are also discussed.

Published in:

Electrical and Computer Engineering, 2004. Canadian Conference on  (Volume:4 )

Date of Conference:

2-5 May 2004