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Impact of body bias on alpha- and neutron-induced soft error rates of flip-flops

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12 Author(s)
Karnik, T. ; Circuits Res., Intel Labs., Hillsboro, OR, USA ; Tschanz, J. ; Bloechel, B. ; Hazucha, P.
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Soft error rate measurements for flip-flops on two testchips in 180nm and 130nm logic technologies show that using forward body bias improves alpha SER by 35% and neutron SER by 23%, while applying reverse body bias degrades SER by 9% to 36%. Body bias impact on SER remains virtually unchanged with technology scaling.

Published in:

VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on

Date of Conference:

17-19 June 2004