By Topic

Impact of body bias on alpha- and neutron-induced soft error rates of flip-flops

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

12 Author(s)
Karnik, T. ; Circuits Res., Intel Labs., Hillsboro, OR, USA ; Tschanz, J. ; Bloechel, B. ; Hazucha, P.
more authors

Soft error rate measurements for flip-flops on two testchips in 180nm and 130nm logic technologies show that using forward body bias improves alpha SER by 35% and neutron SER by 23%, while applying reverse body bias degrades SER by 9% to 36%. Body bias impact on SER remains virtually unchanged with technology scaling.

Published in:

VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on

Date of Conference:

17-19 June 2004