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Browse Conference Publications > VLSI Circuits, 2004. Digest o ... Help

Circuits and techniques for high-resolution measurement of on-chip power supply noise

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3 Author(s)
Alon, E. ; Dept. of Electr. Eng., Stanford Univ., CA, USA ; Stojanovic, V. ; Horowitz, M.

A technique for characterizing the cyclically time varying statistical properties and spectrum of power supply noise using only two on-chip samplers is presented. The samplers utilize a voltage-controlled oscillator to perform high-resolution analog-to-digital conversion with minimal hardware. The measurement system is implemented in a 0.13 μm process as part of a high-speed link transceiver. Measurement results showing the cyclostationary behavior of power supply noise are presented.

Published in:
VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on

Date of Conference: 17-19 June 2004

Page(s):
102 - 105
Print ISBN:
0-7803-8287-0
INSPEC Accession Number:
8058302
Digital Object Identifier :
10.1109/VLSIC.2004.1346518

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