Cart (Loading....) | Create Account
Close category search window
 

Analysis of pilot-symbol aided channel estimation for MIMO-OFDM systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Han Zhang ; Nat. Key Lab. of Commun., Univ. of Electron. Sci. & Technol. of China, China ; Jiming Chen ; Youxi Tang ; Shaoqian Li

Multiple transmit and receive antennas can be used to form multiple-input multiple-output (MIMO) channels to increase the capacity by a factor of the minimum number of transmit and receive antennas. Orthogonal frequency division multiplexing (OFDM) for MIMO channels (MIMO-OFDM) can improve the performance by mitigating intersymbol interference and enhancing system capacity. The paper investigates pilot-symbol aided channel estimation (PSACE) for MIMO-OFDM systems. Two approaches are investigated: first, zero pilot patterns use all available pilot symbols simultaneously; second, a nonzero pilot pattern is allocated for each transmit antenna exclusively. The Wiener filters are derived for both approaches.

Published in:

Communications, Circuits and Systems, 2004. ICCCAS 2004. 2004 International Conference on  (Volume:1 )

Date of Conference:

27-29 June 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.