By Topic

Temperature dependence of the surface reactance in YBa2Cu3O7-δ thin films measured by using quasi-optical sapphire resonator

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Barannik, A.A. ; A.Ya. Usikov Inst. of Radiophys. & Electron., Nat. Acad. of Sci. of Ukraine, Kharkiv, Ukraine ; Bunyaev, S.A. ; Cherpak, N.T. ; Prokopenko, Yu.V.
more authors

In this present paper the authors deploy a novel technique,a method based on using quasi-optical dielectric resonator (QDR), to measure reactance properties of HTS films at millimeter (mm) frequencies. The technique has been shown earlier to use for accurate measurements of the film surface resistance Rs. However a challenge to analogous measurement of HTS surface reactance still remains. The latter is connected with a number of difficulties which must be overcome in order to obtain Xs from the measurement results as follows: 1) necessity of temperature dependence knowledge of material dielectric constant ε which the given resonator is made of; 2) some nonreproducibility of eigen frequencies for the QDR with conducting endplates (CEP) at rearrangements of the resonator; 3) absence of rigid electrodynamic analysis of open ODR and impossibility, in this connection, of finding eigen frequencies for the QDR with perfect CEP.

Published in:

Physics and Engineering of Microwaves, Millimeter, and Submillimeter Waves, 2004. MSMW 04. The Fifth International Kharkov Symposium on  (Volume:1 )

Date of Conference:

21-26 June 2004