Cart (Loading....) | Create Account
Close category search window
 

Recent results on using computer-generated submm-wave holograms for antenna and RCS measurements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Raisanen, A.V. ; MilliLab, Helsinki Univ. of Technol., Finland ; Koskinen, T. ; Lonnqvist, A. ; Hakli, J.
more authors

Computer-generated holograms (diffractive elements) can be used for shaping submillimeter-wave beams, e.g., for producing a plane wave in a compact space. An amplitude hologram has proved to be a feasible alternative as a focusing element in a compact antenna test range (CATR) at submm-wavelengths. In a recent study, we have designed and constructed a compact antenna test range for 322 GHz and measured the ADMIRALS representative test object, which is a 1.5-meter offset paraboloid antenna. In another study, the feasibility of a phase hologram based RCS (radar cross section) range has been verified with simple test objects.

Published in:

Physics and Engineering of Microwaves, Millimeter, and Submillimeter Waves, 2004. MSMW 04. The Fifth International Kharkov Symposium on  (Volume:1 )

Date of Conference:

21-26 June 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.