Cart (Loading....) | Create Account
Close category search window
 

A hierarchical neural network model based on a C/V segmentation algorithm for isolated Mandarin speech recognition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Jhing-Fa Wang ; Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan ; Chung-Hsien Wu ; Shih-Hung Chang ; Lee, Jau-Yien

A novel algorithm simultaneously performing consonant/vowel (C/V) segmentation and pitch detection is proposed. Based on this algorithm, a consonant enhancement method and a hierarchical neural network scheme are explored for Mandarin speech recognition. As a result, an improvement of 12% in consonant recognition rate is obtained and the number of recognition candidates is reduced from 1300 to 63. A series of experiments over all Mandarin syllables (about 1300) is demonstrated in the speaker-dependent mode. Comparisons with the decoder timer waveform algorithm are evaluated to show that the performance is satisfactory. An overall recognition rate of 90.14% is obtained

Published in:

Signal Processing, IEEE Transactions on  (Volume:39 ,  Issue: 9 )

Date of Publication:

Sep 1991

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.