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Temperature dependence of single-event transient current induced by heavy-ion microbeam on p+/n/n+ epilayer junctions

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7 Author(s)
Gang Guo ; Dept. of Nucl. Phys., China Inst. of Atomic Energy, Beijing, China ; Hirao, T. ; Laird, Jamie Stuart ; Onoda, S.
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The temperature dependence of the single event transient current induced by using 15-MeV oxygen heavy-ion microbeam strike on p+/n/n+ epilayer junction diodes has been experimentally investigated over a temperature range of approximately 290 to 450 K. It was found that the heavy-ion induced single event transient currents show different behavior for different temperatures while the collected charges almost keep constant over the temperature range considered.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:51 ,  Issue: 5 )

Date of Publication:

Oct. 2004

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