Referenced Items are not available for this document.
The authors have calculated the optimal index of refraction and thickness of an antireflection coating layer for optical modes (TE/TM) in semiconductor laser devices. They have taken into account various correction factors concerning the two-dimensional carrier gas, i.e. the change in photonic energy depending on the width of the quantum well, the resulting change in refractive indexes, and the change in effective masses of the carriers. The value √
Published in:
Lightwave Technology, Journal of
(Volume:10
,
Issue:
4
)
Date of Publication: Apr 1992
- Page(s):
- 469 - 476
- ISSN :
- 0733-8724
- INSPEC Accession Number:
- 4179754
- Digital Object Identifier :
- 10.1109/50.134200
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Apr 1992
- Sponsored by :
- IEEE Aerospace and Electronic Systems Society
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