Cart (Loading....) | Create Account
Close category search window

An electromagnetic microscope for eddy current evaluation of materials

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Podney, W.N. ; SQM Technol. Inc., La Jolla, CA ; Czipott, P.V.

The concept for a novel instrument to be used in nondestructive evaluation (NDE) is presented. It is called an electromagnetic microscope, formed by superconductive microprobes arrayed in parallel rows. When moved over a test piece, the array generates a scanned image of flaws, stress variations, or changes in composition. Each microprobe comprises drive coils a few millimeters in radius that encircle pickup loops forming a concentric superconducting quantum interference device (SQUID). Drive coils transmit an oscillating magnetic field that induces eddy or magnetization currents in conductive or ferromagnetic materials, respectively. The gradiometer senses distortions in paths of induced currents. The extreme sensitivity of SQUIDS increases sensitivity, penetration depth, and spatial resolution over existing eddy current and magnetic NDE systems. Estimates of performance predict that a current of 1 A oscillating at 1 kHz in the drive coils allows detection of a flaw 0.1-mm in diameter to a depth of several millimeters in aluminum, with a horizontal resolution of about 1 mm and a vertical resolution of 0.3 mm or so

Published in:

Magnetics, IEEE Transactions on  (Volume:27 ,  Issue: 2 )

Date of Publication:

Mar 1991

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.