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Robust technique for on-chip DC current measurements

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2 Author(s)
C. K. L. Tam ; DFT Microsystems Canada Inc., Montreal, Que., Canada ; G. W. Roberts

A robust and highly scalable technique for measuring DC currents is described. The circuit consists largely of digital electronics except for a comparator and a passive RC filter. This simple structure is able to force a voltage at a circuit node while measuring the current that flows into it. The technique has been successfully demonstrated using a prototype constructed using a 0.35 /spl mu/m CMOS chip.

Published in:

IEE Proceedings - Circuits, Devices and Systems  (Volume:151 ,  Issue: 4 )