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In this paper, a new reseeding architecture for scan-based built-in self-test (BIST), which uses a linear feedback shift register (LFSR) as test pattern generator, is proposed. Multiple cells of the LFSR are utilized as sources for feeding the scan chain of the circuit under test in different test phases. The LFSR generates the same state sequence in all phases, keeping that way the implementation cost low. A seed-selection algorithm is furthermore presented that, taking advantage of the multiphase architecture, manages to significantly reduce the number of the required seeds for achieving complete (100%) fault coverage. The proposed technique can be used either in a full BIST implementation or in a test-resource partitioning scenario, since the test-data storage requirements on the tester are very low. When a full BIST implementation is preferable, the multiphase architecture can also be combined with a dynamic reseeding scheme that uses combinational logic instead of a ROM in order to perform the reseedings. This way the implementation area of the BIST circuitry is further reduced. Experimental results demonstrate the advantages of the proposed LFSR reseeding approach over the already known reseeding techniques.