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Modeling of wave propagation in layered piezoelectric media by a recursive asymptotic method

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2 Author(s)
Lugen Wang ; Edison Joining Technol. Center, Ohio State Univ., Columbus, OH, USA ; S. I. Rokhlin

In this paper, a simple asymptotic method to compute wave propagation in a multilayered general anisotropic piezoelectric medium is discussed. The method is based on explicit second and higher order asymptotic representations of the transfer and stiffness matrices for a thin piezoelectric layer. Different orders of the asymptotic expansion are obtained using Pade approximation of the transfer matrix exponent. The total transfer and stiffness matrices for thick layers or multilayers are calculated with high precision by subdividing them into thin sublayers and combining recursively the thin layer transfer and stiffness matrices. The rate of convergence to the exact solution is the same for both transfer and stiffness matrices; however, it is shown that the growth rate of the round-off error with the number of recursive operations for the stiffness matrix is twice that for the transfer matrix; and the stiffness matrix method has better performance for a thick layer. To combine the advantages of both methods, a hybrid method which uses the transfer matrix for the thin layer and the stiffness matrix for the thick layer is proposed. It is shown that the hybrid method has the same stability as the stiffness matrix method and the same round-off error as the transfer matrix method. The method converges to the exact transfer/stiffness matrices essentially with the precision of the computer round-off error. To apply the method to a semispace substrate, the substrate was replaced by an artificial perfect matching layer. The computational results for such an equivalent system are identical with those for the actual system. In our computational experiments, we have found that the advantage of the asymptotic method is its simplicity and efficiency.

Published in:

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control  (Volume:51 ,  Issue: 9 )