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AMCXO and its test system

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4 Author(s)
Wei Zhou ; Dept. of Meas. & Instrum., Xidian Univ., Xi'an, China ; Hai Wang ; Jianning Gao ; L. Bai

In this paper, we introduce a novel temperature compensated crystal oscillator - analog memory compensated crystal oscillator (AMCXO), a microcomputer compensated crystal oscillator (MCXO) based on an analogue approach, and we compare the performance between MCXO and AMCXO, arid analyze the necessity of developing AMCXO. Both AMCXO and MCXO, combined with their test systems, use computers to generate the control signals used for the compensated crystal oscillators according to temperature variation. However, the execution devices are much different from each other in the practical temperature compensated crystal oscillators. A MCXO uses a set of digital units, including a microprocessor, to realize the compensation. For it, equations or tables are used to express the relationship between the control signal and temperature. An AMCXO uses an analogue memory, which has the same functions as the digital units of MCXO. For AMCXO, a curve or figure based on the equations or tables is used to express the same relationship. Their test systems have obvious distinctions in temperature experiment, data acquisition, and processing. A better performance will be obtained by using a more complicated AMCXO test system, and the cost can be reduced at the same time.

Published in:

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control  (Volume:51 ,  Issue: 9 )