Close category search window
 

Pruning local feature correspondences using shape context

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Carneiro, G. ; Dept. of Comput. Sci., Toronto Univ., Ont., Canada ; Jepson, A.D.

We propose a novel approach to improve the distinctiveness of local image features without significantly affecting their robustness with respect to image deformations. Local image features have proven to be successful in computer vision tasks involving partial occlusion, background noise, and various types of image deformations. However, the relatively high number of outliers that have to be rejected from the correspondences set, formed during the search for similar features, still plagues this approach. The task of rejecting outliers is usually based on estimating the global spatial transform suffered by the features in the correspondences set. This presents two problems: (i) it cannot properly deal with non-rigid objects, and (ii) it is sensitive to a high number of outliers. Here, we address these problems by combining typical local features with shape context. A performance evaluation shows that this new semi-local feature generally provides higher distinctiveness and robustness to image deformations, thus potentially increasing the inlier/outlier ratio in the correspondences set. Also, we show that in wide baseline stereo matching, and non-rigid motion applications, the use of the novel semi-local feature not only provides robustness to non-rigid deformations, but also produces a higher inlier/outlier ratio than the standard Hough clustering of the global spatial transform of parameters.

Published in:
Pattern Recognition, 2004. ICPR 2004. Proceedings of the 17th International Conference on  (Volume:3 )

Date of Conference: 23-26 Aug. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.